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1. Rotorcraft Certification By Simulation and Analysis
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2025, Springer International Publishing AG
ISBN-13: 9783031863974
New Delhi, DELHI, INDIA
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2. Rotorcraft Certification By Simulation and Analysis
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2025, Springer International Publishing AG
ISBN-13: 9783031863974
New Delhi, DELHI, INDIA
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3. Rotorcraft Certification By Simulation and Analysis
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2025, Springer International Publishing AG
ISBN-13: 9783031863974
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4. Rotorcraft Certification by Simulation and Analysis: An Introduction to the Principles and Practices
by Padfield, Gareth D., and van 't Hoff, Stefan, and Hofmeister, Philipp
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2025, Springer International Publishing AG
ISBN-13: 9783031863974
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5. Rotorcraft Certification By Simulation and Analysis: an Introduction to the Principles and Practices (Springer Aerospace Technology)
by Padfield, Gareth D.
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2025, Springer
ISBN-13: 9783031863974
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6. Measurements-Based Radar Signature Modeling
by Joseph T. Mayhan; John A. Tabaczynski
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2024, Random House Publishing Services
eBook ISBN: 9780262048118
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7. Measurements-Based Radar Signature Modeling; an Analysis Framework
by Mayhan, Joseph T. & John A. Tabaczynski
Seller Description: Like new; text clean and tight; no dust jacket; MIT Lincoln Laboratory Series; 8vo 8"-9" tall; 512 pages. 0262048116. See More Details
2024, The MIT Press
ISBN-13: 9780262048118
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8. Measurements-Based Radar Signature Modeling: an Analysis Framework
by Mayhan, Joseph T.; Tabaczynski, John A.
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2024, MIT Press
ISBN-13: 9780262048118
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9. Measurements-Based Radar Signature Modeling: an Analysis Framework (Mit Lincoln Laboratory Series)
by Mayhan, Joseph T., Tabaczynski, John A.
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2024, The MIT Press
ISBN-13: 9780262048118
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10. Measurements-Based Radar Signature Modeling: An Analysis Framework
by Mayhan, Joseph T, and Tabaczynski, John A
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2024, MIT Press
ISBN-13: 9780262048118
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11. Measurements-Based Radar Signature Modeling: An Analysis Framework
by Mayhan, Joseph T, and Tabaczynski, John A
Seller Description: New. Sewn binding. Cloth over boards. 512 p. Mit Lincoln Laboratory. Intended for college/higher education audience. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers. See More Details
2024, MIT Press
ISBN-13: 9780262048118
Hardcover, New
Columbia, MD, USA
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12. Measurements-Based Radar Signature Modeling: An Analysis Framework
by Mayhan, Joseph T, and Tabaczynski, John A
Seller Description: New. Sewn binding. Cloth over boards. 512 p. Mit Lincoln Laboratory. Intended for college/higher education audience. See More Details
2024, MIT Press
ISBN-13: 9780262048118
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13. Measurements-Based Radar Signature Modeling: an Analysis Framework (Mit Lincoln Laboratory Series)
by Tabaczynski, John A.
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2024, The MIT Press
ISBN-13: 9780262048118
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14. Measurements-Based Radar Signature Modeling: an Analysis Framework (Mit Lincoln Laboratory Series)
by Tabaczynski, John A.
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2024, The MIT Press
ISBN-13: 9780262048118
hardcover, New
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15. Measurements-Based Radar Signature Modeling: An Analysis Framework
by Mayhan, Joseph T, and Tabaczynski, John A
Seller Description: New. Sewn binding. Cloth over boards. 512 p. Mit Lincoln Laboratory. Intended for college/higher education audience. See More Details
2024, MIT Press
ISBN-13: 9780262048118
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16. Measurements-Based Radar Signature Modeling
by Joseph T. Mayhan
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2024, MIT Press
ISBN-13: 9780262048118
Hardcover, New
Galway, IRELAND
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