Field-Ion Microscopy


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Despite the recent progress in developing various microanalytical tools of better spatial resolution and more sensitivity to chemical analyses for the study of various defects in metallic solids the Field-Ion Microscope (FIM) still remains the only instrument up to now to resolve single atoms in the surface of a metal. Fifteen years after Milller!) invented the FIM he was also the first to combine the FIM with a time-of-flight (ToF) mass spectrometer - the so-called Atom-Probe FlM - to identify the chemical nature of single ...

Field-Ion Microscopy 2011, Springer

ISBN-13: 9783642686894

Softcover Reprint of the Origi edition

Trade paperback

Field-Ion Microscopy 1982, Springer, Berlin, Germany

ISBN-13: 9780387117126

Unknown binding