As software systems grow in complexity and scale, ensuring their reliability and quality becomes challenging. Traditional methods of defect detection are time-consuming, prone to errors, and inadequate for identifying issues. To address these limitations, the integration of machine learning (ML) techniques and large language models (LLMs) emerges as a transformative approach in automating software defect detection. ML algorithms can learn from historical bug data to predict vulnerabilities, while LLMs can detect anomalies ...
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As software systems grow in complexity and scale, ensuring their reliability and quality becomes challenging. Traditional methods of defect detection are time-consuming, prone to errors, and inadequate for identifying issues. To address these limitations, the integration of machine learning (ML) techniques and large language models (LLMs) emerges as a transformative approach in automating software defect detection. ML algorithms can learn from historical bug data to predict vulnerabilities, while LLMs can detect anomalies with high accuracy. This convergence holds the potential to improve automation, software engineering, and defect detection, while introducing new challenges in interpretability, data bias, and model reliability that require further exploration. Automating Software Defect Detection Through Machine Learning and LLMs explores how cutting-edge technologies like machine learning (ML) and large language models (LLMs) transform software detection. It examines how these technologies enhance accuracy, scalability, and efficiency in identifying and mitigating software defects. This book covers topics such as algorithms, fraud detection, and software engineering, and is a useful resource for engineers, security professionals, academicians, researchers, and computer scientists.
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Add this copy of Automating Software Defect Detection Through Machine to cart. $211.37, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2025 by Engineering Science Reference.
Add this copy of Automating Software Defect Detection Through Machine to cart. $248.25, like new condition, Sold by GreatBookPrices rated 4.0 out of 5 stars, ships from Columbia, MD, UNITED STATES, published 2025 by Engineering Science Reference.
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Fine. Intended for college/higher education audience. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Add this copy of Automating Software Defect Detection Through Machine to cart. $250.76, new condition, Sold by GreatBookPrices rated 4.0 out of 5 stars, ships from Columbia, MD, UNITED STATES, published 2025 by Engineering Science Reference.
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
New. Intended for college/higher education audience. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Add this copy of Automating Software Defect Detection Through Machine to cart. $251.63, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2025 by IGI Global.
