This book covers several of the most important topics of current interest at the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices.
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This book covers several of the most important topics of current interest at the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices.
Read Less
Add this copy of Advances in Scanning Probe Microscopy to cart. $103.32, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2012 by Springer.
Add this copy of Advances in Scanning Probe Microscopy to cart. $103.32, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2000 by Springer.
Add this copy of Advances in Scanning Probe Microscopy to cart. $108.00, new condition, Sold by Joiedevivre, ships from Chesapeake, VA, UNITED STATES, published 2000 by Springer.
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Seller's Description:
New in very good dust jacket. Sewn binding. Cloth over boards. 343 p. Contains: Unspecified. Advances in Materials Research, 2. Audience: General/trade.
Add this copy of Advances in Scanning Probe Microscopy (Advances in to cart. $118.44, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 2000 by Springer.
