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X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987

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X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, Ny, August 31-September 4, 1987 - Sayre, David (Editor), and Howells, Malcolm (Editor), and Kirz, Janos (Editor)
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This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987. Previous recent symposia on the sub- ject were held in New York in 1979, Gottingen in 1983 and Taipei in 1986. Developments in x-ray microscopy continue at a rapid pace, with im- portant advances in all major areas: x-ray sources, optics and components, and microscopes and imaging systems. Taken as a whole, the work pre- sented here emphasizes three major ...

X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, Ny, August 31-September 4, 1987 2013, Springer

ISBN-13: 9783662144909

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X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31 September 4, 1987 1988, Springer

ISBN-13: 9783540193920

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