VLSI Test Principles and Architectures: Design for Testability

by

Write The First Customer Review

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. . Most up-to-date coverage of design for testability. . Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. . Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. . Lecture slides and ...

VLSI Test Principles and Architectures: Design for Testability 2006, Morgan Kaufmann Publishers, Amsterdam, Netherlands

ISBN-13: 9780123705976

Hardcover

Select
VLSI Test Principles and Architectures: Design for Testability 2006, Morgan Kaufmann Publishers

ISBN-13: 9781493300860

Trade paperback

Select