Total-Reflection X-Ray Fluorescence Analysis

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The first monograph to describe the still young but highly efficient and powerful method of analytical spectroscopy in a comprehensive and clear exposition with numerous cross-references. Outlines the fundamental physical principles and several practical applications of micro- and trace analysis as well as surface and near-surface layer analysis. Compares the competency of TXRF with different competitive techniques and presents future prospects.

Total-Reflection X-Ray Fluorescence Analysis 1996, Wiley-Interscience, New York, NY

ISBN-13: 9780471305248

Hardcover

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