Thermal Testing of Integrated Circuits

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Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.

Thermal Testing of Integrated Circuits 2011, Springer-Verlag New York Inc., New York, NY

ISBN-13: 9781441952875

Paperback

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Thermal Testing of Integrated Circuits 2002, Springer, Boston, MA

ISBN-13: 9781402070761

2002 edition

Hardcover

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