Testing and Testable Design of High-Density Random-Access Memories

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Testing and Testable Design of High-Density Random-Access Memories deals with the study of fault modeling, testing and testable design of semiconductor random-access memories. It is written primarily for the practising design engineer and the manufacturer of random-access memories (RAMs) of the modern age. It provides useful exposure to state-of-the-art testing schemes and testable design approaches for RAMs. It is also useful as a supplementary text for undergraduate courses on testing and testability of RAMs. Testing and ...

Testing and Testable Design of High-Density Random-Access Memories 1996, Springer, Boston, MA

ISBN-13: 9780792397823

1996 edition

Hardcover

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