Semiconductor Material and Device Characterization

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Semiconductor Material and Device Characterization - Schroder, Dieter K
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The first book devoted to modern techniques of semiconductor characterization, this comprehensive guide to semiconductor measurement methods is detailed enough for a two-term graduate course. Organized for quick access so that it can be used as a handbook of specific characterization techniques. Processes are characterized through the use of test structures and the main techniques used within the semiconductor industry are thoroughly explained. While the majority of the book is devoted to widely used electrical ...

Semiconductor Material and Device Characterization 2005, Wiley-IEEE Press

ISBN-13: 9780471739067

3rd edition

Hardcover

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Semiconductor Material and Device Characterization 1998, Wiley-Interscience, New York, NY

ISBN-13: 9780471241393

2nd Revised edition

Hardcover

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Semiconductor Material and Device Characterization 1990, Wiley-Interscience

ISBN-13: 9780471511045

Hardcover

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