Self-Checking and Fault-Tolerant Digital Design


With VLSI chip transistors getting smaller and smaller, today's digital systems are more complex than ever before. This increased complexity leads to more cross-talk, noise, and other sources of transient errors during normal operation. Traditional off-line testing strategies cannot guarantee detection of these transient faults. And with critical applications relying on faster, more powerful chips, fault-tolerant, self-checking mechanisms must be built in to assure reliable operation. Self-Checking and Fault-Tolerant ...

Self-Checking and Fault-Tolerant Digital Design 2000, Morgan Kaufmann Publishers, San Francisco, CA

ISBN-13: 9780124343702