Scanning Microscopy for Nanotechnology: Techniques and Applications

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This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

Scanning Microscopy for Nanotechnology: Techniques and Applications 2010, Springer

ISBN-13: 9781441922090

Trade paperback

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Scanning Microscopy for Nanotechnology: Techniques and Applications 2006, Springer, New York, NY

ISBN-13: 9780387333250

2007 edition

Hardcover

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