Novel Algorithms for Fast Statistical Analysis of Scaled Circuits

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As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably slow. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits draws upon ideas for attacking parallel ...

Novel Algorithms for Fast Statistical Analysis of Scaled Circuits 2012, Springer, Dordrecht

ISBN-13: 9789400736870

2009 edition

Paperback

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Novel Algorithms for Fast Statistical Analysis of Scaled Circuits 2009, Springer, Dordrecht, Netherlands

ISBN-13: 9789048130993

2009 edition

Hardcover

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