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Noncontact Atomic Force Microscopy: Volume 2 - Morita, Seizo (Editor), and Giessibl, Franz J (Editor), and Wiesendanger, Roland (Editor)
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This report on scanning probe microscopy covers the latest in many related topics such as force spectroscopy and mapping with atomic resolution, atomic manipulation, magnetic exchange force microscopy, atomic and molecular imaging in liquids, and much more.

Noncontact Atomic Force Microscopy: Volume 2 2012, Springer

ISBN-13: 9783642260704

2009 edition

Trade paperback

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Noncontact Atomic Force Microscopy: Volume 2 2009, Springer

ISBN-13: 9783642014949

2009 edition

Hardcover

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