Mismatch and Noise in Modern IC Processes

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Component variability, mismatch, and various noise effects are major contributors to design limitations in most modern IC processes. Mismatch and Noise in Modern IC Processes examines these related effects and how they affect the building block circuits of modern integrated circuits, from the perspective of a circuit designer. Variability usually refers to a large scale variation that can occur on a wafer to wafer and lot to lot basis, and over long distances on a wafer. This phenomenon is well understood and the effects of ...

Mismatch and Noise in Modern IC Processes 2009, Morgan & Claypool, San Rafael

ISBN-13: 9781598299410

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