Ionizing Radiation Effects in Mos Oxides

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This volume is intended to serve as an updated critical guide to the extensive literature on the basic physical mechanisms controlling the radiation and reliability responses of MOS oxides. The last such guide was Ionizing Radiation Effects in MOS Devices and Circuits, edited by Ma and Dressendorfer and published in 1989. While that book remains an authoritative reference in many areas, there has been a significant amount of more recent work on the nature of the electrically active defects in MOS oxides which are generated ...

Ionizing Radiation Effects in Mos Oxides 2000, World Scientific Publishing Company, Singapore

ISBN-13: 9789810233266

Hardcover

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