Electron beam analysis of materials

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The examination of materials using electron beam techniques has developed continuously for over twenty years and there are now many different methods of extracting detailed structural and chemical information using electron beams. These techniques which include electron probe microanalysis, trans mission electron microscopy, Auger spectroscopy and scanning electron microscopy have, until recently, developed more or less independently of each other. Thus dedicated instruments designed to optimize the performance for a ...

Electron Beam Analysis of Materials 1993, Chapman and Hall, London

ISBN-13: 9780412477904

2nd edition 1994

Paperback

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Electron Beam Analysis of Materials 1984, Springer, Dordrecht

ISBN-13: 9780412234002

Trade paperback

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Electron Beam Analysis of Materials 1984, Springer, Dordrecht

ISBN-13: 9780412233906

Hardcover

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