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Electromigration in ULSI Interconnections

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Electromigration in ULSI Interconnections - Tan, Cher Ming
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Electromigration in ULSI Interconnections provides a comprehensive description of the electromigration in integrated circuits. It is intended for both beginner and advanced readers on electromigration in ULSI interconnections. It begins with the basic knowledge required for a detailed study on electromigration, and examines the various interconnected systems and their evolution employed in integrated circuit technology. The subsequent chapters provide a detailed description of the physics of electromigration in both Al- and ...

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Electromigration in ULSI Interconnections 2010, World Scientific Publishing Company, Singapore

ISBN-13: 9789814273329

Hardcover

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