Digital Noise Monitoring of Defect Origin

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This book explores the initial stage of the origin of the defect taking into account technical, biological, and other features of several technologies. These technologies allow the defect monitoring at the beginning of the defect origin to be performed at the expense of extracting information from the noise. This book appeals to a wide audience focused on solving numerous problems.

Digital Noise Monitoring of Defect Origin 2010, Springer-Verlag New York Inc., New York, NY

ISBN-13: 9781441944108

Trade paperback

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Digital Noise Monitoring of Defect Origin 2007, Springer, Berlin, Germany

ISBN-13: 9780387717531

2007 edition

Hardcover

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