Design for Manufacturability and Yield for Nano-scale CMOS

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This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a SOC design flow and addresses a new topic (DFM/DFY) critical at 90 nm and beyond. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development.

Design for Manufacturability and Yield for Nano-Scale CMOS 2010, Springer, Dordrecht

ISBN-13: 9789048173037

Paperback

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Design for Manufacturability and Yield for Nano-Scale CMOS 2007, Springer, Dordrecht, Netherlands

ISBN-13: 9781402051876

Hardcover

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