Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

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Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex and demand ...

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2010, Springer

ISBN-13: 9781441942852

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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2007, Springer, Dordrecht, Netherlands

ISBN-13: 9780387465463

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