Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

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The 2 nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its ...

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2010, Springer

ISBN-13: 9781441942852

2nd edition

Trade paperback

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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2007, Springer, Dordrecht, Netherlands

ISBN-13: 9780387465463

2nd edition

Hardcover

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