Characterization of High Tc Materials and Devices by Electron Microscopy

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A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors.

Characterization of High Tc Materials and Devices by Electron Microscopy 2015, Cambridge University Press, Cambridge, England

ISBN-13: 9780521554909

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Characterization of High Tc Materials and Devices by Electron Microscopy 2006, Cambridge University Press, Cambridge

ISBN-13: 9780521031707

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