Bias Temperature Instability for Devices and Circuits

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This book provides a reference to one of the more challenging reliability issues plaguing modern semiconductor technologies. It introduces a new defect model for metastable defect states, nonradiative multiphonon theory and stochastic behavior.

Bias Temperature Instability for Devices and Circuits 2016, Springer

ISBN-13: 9781493955299

Softcover Reprint of the Origi edition

Trade paperback

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Bias Temperature Instability for Devices and Circuits 2013, Springer

ISBN-13: 9781461479086

2014 edition

Hardcover

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