Advances in X-Ray Analysis: Volume 20

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X-ray diffraction as a method of qualitative analysis for crystal- line phases has been long accepted, and has had constant improvement in method and equipment. It has also been made more useful by the growth and improvement of the data collection available as reference standards. In recent years some attempts have been made to use the method to a greater extent by furnishing results on a quantitative basis. This has proved to be difficult because of the problem of comparing the relative intensities of the diffraction peaks ...

Advances in X-Ray Analysis: Volume 20 2012, Springer-Verlag New York Inc., New York, NY

ISBN-13: 9781461399834

Paperback

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Advances in X-Ray Analysis: Volume 20 1977, Springer, Boston, MA

ISBN-13: 9780306381201

Hardcover

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