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X-Ray Metrology in Semiconductor Manufacturing

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X-Ray Metrology in Semiconductor Manufacturing

by D Keith Bowen, Tanner Brian K

About this title: The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved using x-rays. While many books are available on the theory behind x-ray metrology (XRM), "X-Ray Metrology in Semiconductor Manufacturing" is the first book to focus on the practical aspects of the technology and its application in device fabrication and solving new materials problems. Following a general overview of the field, the first section of the book is organized by ... read more

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X-Ray Metrology in Semiconductor Manufacturing new book

X-Ray Metrology in Semiconductor Manufacturing

by D. Keith Bowen; Brian K. Tanner

price: $133.48

Ships from TX, USA Order this item today and it should be delivered to addresses in the continental United States and in Canada by Thursday, December 24.

Binding: Hardcover Publisher: CRC Date Published: 2006-01-24 ISBN-13: 9780849339288 ISBN: 0849339286

Description: New. Brand New. Never Used. read more

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Book: New

Available qty: 3

 

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Reliability: Best

X-Ray Metrology in Semiconductor Manufacturing new book

X-Ray Metrology in Semiconductor Manufacturing

by D. Keith Bowen; Brian K. Tanner

price: $133.49

Ships from TX, USA Order this item today and it should be delivered to addresses in the continental United States and in Canada by Thursday, December 24.

Binding: Hardcover Publisher: CRC Date Published: 2006-01-24 ISBN-13: 9780849339288 ISBN: 0849339286

Description: New. Brand New. Never Used. read more

condition:

Book: New

Available qty: 3

 

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Name: ExtremelyReliable, TX, USA

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X-Ray Metrology in Semiconductor Manufacturing new book

X-Ray Metrology in Semiconductor Manufacturing

by Bowen, D. Keith; Tanner, Brian K.

price: $144.31

Ships from MI, USA Order this item today and it should be delivered to addresses in the continental United States and in Canada by Thursday, December 24.

Binding: Hardcover Publisher: CRC ISBN-13: 9780849339288 ISBN: 0849339286

Description: New. 0849339286 BRAND-NEW. FAST Fedex shipping. In business for over 15 years, EXCEPTIONAL customer service (TF30). read more

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X-Ray Metrology in Semiconductor Manufacturing new book

X-Ray Metrology in Semiconductor Manufacturing

by D. Keith Bowen Brian K. Tanner

price: $160.05

Ships from WARKS, UNITED KINGDOM

Binding: Hardback Publisher: Taylor & Francis(CRC Press) Date Published: 2006 ISBN-13: 9780849339288 ISBN: 0849339286

Description: BRAND NEW HARDBACK. Written by established world experts, x-ray metrology in semiconductor manufacturing describes the applications, science, and technology of this rapidly evolving area. this book emphasizes practical metrology, with real world examples from the semiconductor and mag*n*e*t*ics industries. the authors discuss the techniques, theory, and applications of x-ray metrology in semiconductors and other advanced thin films. the book covers the essential metrological questions of ... read more

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Book: New

 

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Name: Quartermelon, WARKS, UNITED KINGDOM

Reliability: Best

X-Ray Metrology in Semiconductor Manufacturing new book

X-Ray Metrology in Semiconductor Manufacturing

by Bowen, D. Keith

price: $127.58

Ships from NJ, USA Order this item today and it should be delivered to addresses in the continental United States and in Canada by Thursday, December 24.

ISBN-13: 9780849339288 ISBN: 0849339286

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Book: New

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Name: indoo, NJ, USA

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X-Ray Metrology in Semiconductor Manufacturing new book

X-Ray Metrology in Semiconductor Manufacturing

by Bowen, D. Keith, Tanner, Brian K.

price: $128.46

Ships from NJ, USA Order this item today and it should be delivered to addresses in the continental United States and in Canada by Thursday, December 24.

ISBN-13: 9780849339288 ISBN: 0849339286

Description: New. NO EXPEDITED SHIPPING! Brand new item. read more

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Book: New

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X-Ray Metrology in Semiconductor Manufacturing used book

X-Ray Metrology in Semiconductor Manufacturing

by D. Keith Bowen

price: $161.06

Ships from FL, USA Order this item today and it should be delivered to addresses in the continental United States and in Canada by Thursday, December 24.

Binding: Hardcover Publisher: CRC Date Published: 2006 ISBN-13: 9780849339288 ISBN: 0849339286

Description: Very good. read more

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Book: Very Good

Available qty: 4

 

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Name: More Books, FL, USA

Reliability: High

X-Ray Metro new book

X-Ray Metro

by Bowen David K

price: $167.10

Ships from MERSEYSIDE, UNITED KINGDOM

ISBN-13: 9780849339288 ISBN: 0849339286

Description: BRAND NEW FROM THE SAINT BOOKSTORE. read more

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Name: The Saint Bookstore, MERSEYSIDE, UNITED KINGDOM

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X-Ray Metrology in Semiconductor Manufacturing new book

X-Ray Metrology in Semiconductor Manufacturing

by D. Keith Bowen; Brian K. Tanner

price: $167.96

Ships from NJ, USA Order this item today and it should be delivered to addresses in the continental United States and in Canada by Thursday, December 24.

Binding: Hardcover Publisher: Taylor & Francis ISBN-13: 9780849339288 ISBN: 0849339286

Description: New. PLEASE NOTE: All books are promptly imported from the UK using DHL or Royal Mail international mail WITH TRACKING NUMBER. Delivery is typically 5-10 working days. Please do not select expedited shipping. Professional and reliable bookseller (est.1987). Written by established world experts, X-Ray Metrology in Semiconductor Manufacturing describes the applications, science, and technology of this rapidly evolving area. This book emphasizes practical metrology, with real world examples from ... read more

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Book: New

Available qty: 2

 

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Name: Books Express USA, NJ, USA

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X-Ray Metrology in Semiconductor Manufacturing new book

X-Ray Metrology in Semiconductor Manufacturing

by D. Keith Bowen

price: $194.20

Ships from FL, USA Order this item today and it should be delivered to addresses in the continental United States and in Canada by Thursday, December 24.

Binding: Hardcover Publisher: CRC Date Published: 2006 ISBN-13: 9780849339288 ISBN: 0849339286

Description: New. read more

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Book: New

Available qty: 4

 

seller information:

Name: More Books, FL, USA

Reliability: High

X-Ray Metrology in Semiconductor Manufacturing new book

X-Ray Metrology in Semiconductor Manufacturing

by Bowen, D Keith, and Tanner Brian K

price: $133.70

Ships from NJ, USA Order this item today and it should be delivered to addresses in the continental United States and in Canada by Thursday, December 24.

Binding: Hardcover Publisher: CRC Press Date Published: 2006 ISBN-13: 9780849339288 ISBN: 0849339286

Description: New. Satisfaction Guranteed: Unused Very good condition. Glued binding. Paper over boards. 279 p. Contains: Illustrations. read more

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Book: New

 

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Name: NJ BOOKS STORE, NJ, USA

Reliability: Average

X-Ray Metrology in Semiconductor Manufacturing new book

X-Ray Metrology in Semiconductor Manufacturing

by Bowen, D Keith, and Tanner Brian K

price: $133.70

Ships from INDIA

Binding: Hardcover Publisher: CRC Press Date Published: 2006 ISBN-13: 9780849339288 ISBN: 0849339286

Description: New. Satisfaction Guranteed: Unused Very good condition. Glued binding. Paper over boards. 279 p. Contains: Illustrations. read more

condition:

Book: New

 

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Name: Books International, INDIA

Reliability: Average

X-Ray Metrology in Semiconductor Manufacturing new book

X-Ray Metrology in Semiconductor Manufacturing

by D. Keith Bowen; Brian K. Tanner

price: $173.01

Ships from UNITED KINGDOM

Binding: Hardcover Publisher: Taylor & Francis ISBN-13: 9780849339288 ISBN: 0849339286

Description: New. PLEASE NOTE: All books are promptly shipped from our UK warehouse using Royal Mail International Priority mail. Heavier or more expensive books are shipped with a TRACKING NUMBER. Professional and reliable bookseller (est.1987). Written by established world experts, X-Ray Metrology in Semiconductor Manufacturing describes the applications, science, and technology of this rapidly evolving area. This book emphasizes practical metrology, with real world examples from the semiconductor and ... read more

condition:

Book: New

Available qty: 2

 

seller information:

Name: Books Express, UNITED KINGDOM

Reliability: Average

X-Ray Metrology in Semiconductor Manufacturing new book

X-Ray Metrology in Semiconductor Manufacturing

by Bowen, D Keith, and Tanner Brian K

price: $134.20

Ships from PA, USA Order this item today and it should be delivered to addresses in the continental United States and in Canada by Thursday, December 24.

Binding: Hardcover Publisher: CRC Press Date Published: 2006 ISBN-13: 9780849339288 ISBN: 0849339286

Description: New. Satisfaction Guranteed: Unused Very good condition. Glued binding. Paper over boards. 279 p. Contains: Illustrations. read more

condition:

Book: New

 

seller information:

Name: Sparkzz Int, PA, USA

Reliability: Low


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