About this title: The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials ...
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Description: Taylor & Francis, 1998. Hardcover, 252 pages. Signed by both authors on front endpaper (but I've known doctors with better handwriting). Bumped corners. Good condition. read more
Binding: Hardcover
Publisher: Taylor & Francis Ltd
Date Published: 1998
ISBN-13:9780850667585ISBN:0850667585
Description: Fine. Slightly shelf worn, however book is unread. Next day dispatch by Royal Mail. International delivery available. 1000's of satisfied customers! Please contact us with any queries. Next working day dispatch from the UK. Please contact us with any queries. read more
Binding: Hardback
Publisher: Taylor & Francis
Date Published: 1998
ISBN-13:9780850667585ISBN:0850667585
Description: BRAND NEW HARDBACK. 9.685 by 6.85 inches. This book is printed on demand. (allow 1-2 weeks for printing) (264 pages) introduction-diffraction studies of crystal perfection, high resolution x-ray diffraction techniques, analysis of expitaxial layers, x-ray scattering theory, simulation of x-ray diffraction rocking curves, analysis of thin films and multiple layers, triple axis x-ray diffractometry, single crystal x-ray topography, double crystal x-ray topography, synchrotron radiation topography ... read more
Binding: Hardback
Publisher: CRC PR INC
Date Published: 1998
ISBN-13:9780850667585ISBN:0850667585
Description: New. The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the mode... read more
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