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High Resolution X-Ray Diffractometry and Topography

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High Resolution X-Ray Diffractometry and Topography

by D Keith Bowen, Keith D Bowen, Brian K Tanner

About this title: The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the ... read more

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High Resolution X-Ray Diffractometry and Topography used book

High Resolution X-Ray Diffractometry and Topography

by D.K. Bowen, B.K. Tanner

price: $103.85

Ships from , UNITED KINGDOM Order this item today and it should be delivered to any address by Thursday, December 24.

Binding: Hardcover Publisher: Taylor & Francis Ltd Date Published: 1998 ISBN-13: 9780850667585 ISBN: 0850667585

Description: Fine. Slightly shelf worn, however book is unread. Next day dispatch by Royal Mail. International delivery available. 1000's of satisfied customers! Please contact us with any queries. Next working day dispatch from the UK. Please contact us with any queries. read more

condition:

Book: Fine/Like New

 

seller information:

Name: Orbiting Books, , UNITED KINGDOM

Reliability: Best

High Resolution X-Ray Diffractometry and Topography new book

High Resolution X-Ray Diffractometry and Topography

by D.K. Bowen B.K. Tanner

price: $150.26

Ships from WARKS, UNITED KINGDOM Order this item today and it should be delivered to any address by Thursday, December 24.

Binding: Hardback Publisher: Taylor & Francis Date Published: 1998 ISBN-13: 9780850667585 ISBN: 0850667585

Description: BRAND NEW HARDBACK. 9.685 by 6.85 inches. This book is printed on demand. (allow 1-2 weeks for printing) (264 pages) introduction-diffraction studies of crystal perfection, high resolution x-ray diffraction techniques, analysis of expitaxial layers, x-ray scattering theory, simulation of x-ray diffraction rocking curves, analysis of thin films and multiple layers, triple axis x-ray diffractometry, single crystal x-ray topography, double crystal x-ray topography, synchrotron radiation topography ... read more

condition:

Book: New

 

seller information:

Name: Quartermelon, WARKS, UNITED KINGDOM

Reliability: Best

High Resolution X-Ray Diffractometry and Topography new book

High Resolution X-Ray Diffractometry and Topography

by D.K. Bowen; Brian K. Tanner

price: $156.72

Ships from TX, USA Order this item today and it should be delivered to any address by Thursday, December 24.

Binding: Hardcover Publisher: CRC Date Published: 1998-02-05 ISBN-13: 9780850667585 ISBN: 0850667585

Description: New. Brand New. Never Used. read more

condition:

Book: New

Available qty: 3

 

seller information:

Name: ExtremelyReliable, TX, USA

Reliability: Best

High Resolution X-Ray Diffractometry and Topography new book

High Resolution X-Ray Diffractometry and Topography

by D.K. Bowen, B.K. Tanner

price: $161.40

Ships from SURREY, UNITED KINGDOM Order this item today and it should be delivered to any address by Thursday, December 24.

Binding: Hardcover Publisher: Taylor & Francis Date Published: 1998 ISBN-13: 9780850667585 ISBN: 0850667585

Description: New. BRAND NEW and ready for dispatch. Delivery normally within 4/7 days. Our reputation is built on our Speedy Delivery Service and our Customer Service Team. read more

condition:

Book: New

 

seller information:

Name: The Perfect Book Store Ltd, SURREY, UNITED KINGDOM

Reliability: Best

High Resolution X-Ray Diffractometry and Topography new book

High Resolution X-Ray Diffractometry and Topography

by Bowen, D Keith, and Bowen, Keith D, and Tanner, Brian K

price: $161.94

Ships from NV, USA Order this item today and it should be delivered to any address by Thursday, December 24. Eligible for Super Value Shipping

Binding: Hardcover Publisher: CRC Press Date Published: 1998 ISBN-13: 9780850667585 ISBN: 0850667585

Description: New. Sewn binding. Cloth over boards. 264 p. read more

condition:

Book: New

Available qty: >10

 

seller information:

Name: Alibris, NV, USA
Eligible for free shipping

Reliability: Best

High Resolution X-Ray Diffractometry and Topography new book

High Resolution X-Ray Diffractometry and Topography

by D.K. Bowen; Brian K. Tanner

price: $180.41

Ships from TX, USA Order this item today and it should be delivered to any address by Thursday, December 24.

Binding: Hardcover Publisher: CRC Date Published: 1998-02-05 ISBN-13: 9780850667585 ISBN: 0850667585

Description: New. Brand New. Never Used. read more

condition:

Book: New

Available qty: 3

 

seller information:

Name: ExtremelyReliable, TX, USA

Reliability: Best

High Resolution X-Ray Diffractometry and Topography used book

High Resolution X-Ray Diffractometry and Topography

by Bowen, D. Keith And Tanner, Brian K.

price: $100.00

Ships from CA, USA Order this item today and it should be delivered to any address by Thursday, December 24.

Edition: First Edition Binding: Hardcover Publisher: Taylor and Francis, London Date Published: 1998 ISBN-13: 9780850667585 ISBN: 0850667585

Description: Fine. INSCRIBED AND SIGNED BY AUTHOR ("KEITH") read more

condition:

Book: Fine/Like New

 

seller information:

Name: Feldman's Books, CA, USA

Reliability: High

High Resolution X-Ray Diffractometry and Topograph new book

High Resolution X-Ray Diffractometry and Topograph

by Bowen, D. Keith; Bowen, Keith D. And Tan

price: $132.63

Ships from IL, USA Order this item today and it should be delivered to any address by Thursday, December 24.

Binding: Hardback Publisher: CRC PR INC Date Published: 1998 ISBN-13: 9780850667585 ISBN: 0850667585

Description: New. The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the mode... read more

condition:

Book: New

Available qty: >10

 

seller information:

Name: Paperbackshop, IL, USA

Reliability: High

High Resolution X-Ray Diffractometry and Topography new book

High Resolution X-Ray Diffractometry and Topography

by Bowen D.K.

price: $149.01

Ships from NY, USA Order this item today and it should be delivered to any address by Thursday, December 24.

Binding: Hardcover Publisher: Taylor & Francis Group Date Published: 1998 ISBN-13: 9780850667585 ISBN: 0850667585

Description: (NEW TITLE), Size 25cm, pp. 264. read more

condition:

Book: New

Available qty: 3

 

seller information:

Name: finebook, NY, USA

Reliability: High

High Resolution X-Ray Diffractometry and Topography new book

High Resolution X-Ray Diffractometry and Topography

by D.K. Bowen; B.K. Tanner

price: $158.97

Ships from NJ, USA Order this item today and it should be delivered to any address by Thursday, December 24.

Binding: Hardcover Publisher: Taylor & Francis ISBN-13: 9780850667585 ISBN: 0850667585

Description: New. PLEASE NOTE: All books are promptly imported from the UK using DHL or Royal Mail international mail WITH TRACKING NUMBER. Print on demand title. D elivery is typically 8-12 working days. Please do not select expedited shipping. Professional and reliable bookseller (est.1987). The application of electronic materials has created a demand for reliable techniques for examining these materials. This book looks at the area of x-ray diffraction and the modern techniques available for deployment ... read more

condition:

Book: New

Available qty: >10

 

seller information:

Name: Books Express USA, NJ, USA

Reliability: High

High Resolution X-Ray Diffractometry and Topography new book

High Resolution X-Ray Diffractometry and Topography

by Bowen, D.K., Tanner, Brian K.

price: $177.72

Ships from NJ, USA Order this item today and it should be delivered to any address by Thursday, December 24.

Binding: Hardcover ISBN-13: 9780850667585 ISBN: 0850667585

Description: New. Brand new book. read more

condition:

Book: New

Available qty: >10

 

seller information:

Name: A1Books, NJ, USA

Reliability: High

High Resolution X-Ray Diffractometry and Topography new book

High Resolution X-Ray Diffractometry and Topography

by D.K. Bowen; B.K. Tanner

price: $161.11

Ships from UNITED KINGDOM Order this item today and it should be delivered to any address by Thursday, December 24.

Binding: Hardcover Publisher: Taylor & Francis ISBN-13: 9780850667585 ISBN: 0850667585

Description: New. PLEASE NOTE: All books are promptly shipped from our UK warehouse using Royal Mail or DHL. International Priority mail for non-UK deliveries. Print on demand title. Delivery is typically 7-10 working days for UK delivery. Heavier or more expensive books are shipped with a TRACKING NUMBER. Professional and reliable bookseller (est.1987). The application of electronic materials has created a demand for reliable techniques for examining these materials. This book looks at the area of x-ray ... read more

condition:

Book: New

Available qty: >10

 

seller information:

Name: Books Express, UNITED KINGDOM

Reliability: Average

High Resolution X-Ray Diffractometry and Topography new book

High Resolution X-Ray Diffractometry and Topography

by Bowen, D Keith, And Bowen, Keith D, And Tanner, Brian K

price: $134.94

Ships from MD, USA Order this item today and it should be delivered to any address by Thursday, December 24.

Binding: Hardcover ISBN-13: 9780850667585 ISBN: 0850667585

Description: New in very good dust jacket. read more

condition:

Book: New

 

seller information:

Name: booksfan, MD, USA

Reliability: Low


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