About this title: Providing a comprehensive introduction to the capabilities and use of scanning electron microscopes (SEM) and x-ray spectrometers, this highly acclaimed text emphasizes practical aspects of imaging and analysis for a broad audience of students and practitioners whose backgrounds span a wide range of science and technology. Topics discussed include ...
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Note: This is a general synopsis. Each listing is described below.
Edition: 3rd
Binding: Hardcover
Publisher: Springer
Date Published: 2003-02
ISBN-13:9780306472923ISBN:0306472929
Description: Very good. Very minimal damage to the cover (no holes or tears, only minimal scuff marks), in some instances dust jackets are not included, no missing pages, minimal to no highlighting/under. read more
Binding: Hardcover
Publisher: Plenum Pub Corp
Date Published: 2002-12-01
ISBN-13:9780306472923ISBN:0306472929
Description: NEW. Hardcover. From an inventory that is 100% brand-new, 100% direct from the publishers' distribution channel. We carry NO pre-owned, NO remaindered. We pack in CARDBOARD to ensure the pristine quality is maintained. (Bubble-wrap alone is NOT sufficient to protect from USPS equipment. ) Guaranteed brand-NEW, protected with CARDBOARD, your satisfaction is guaranteed. BKLUVID: 9780306472923. read more
Description: 0306472929 You'll receive a BRAND-NEW book in perfect condition. IMMEDIATE & FAST UPS shipping. UPS does NOT deliver to PO Boxes or APO addresses, so please give us a physical address to ship to. We cannot ship this item to Alaska or Hawaii. We provide EXCEPTIONAL customer service. We're open 24/7 to serve you best. We've been selling online for over 13 years, over 3 million customers served. Please note that since this item is brand-new & direct from the publisher, it WILL include everything ... read more
Edition: 3 SUB
Binding: Hardback
Publisher: SPRINGER VERLAG GMBH
Date Published: 2002
ISBN-13:9780306472923ISBN:0306472929
Description: New. This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray micro... read more
Binding: Unknown
Publisher: Kluwer Academic Publishers Group
Date Published: 2002
ISBN-13:9780306472923ISBN:0306472929
Description: New. Offers a comprehensive introduction to the capabilities and use of scanning electron microscopes (SEM) and x-ray spectrometers. This book emphasizes practical aspects of imaging and analysis for a broad audience of students and practitioners whose bac... read more
Description: Like New. SHIPS FROM GERMANY. NO EXPEDITED SHIPPING! Allow 10-14 business days for delivery. Please always check the language in the product description section. Few left in stock-order soon. Selling online since 1995. Code: L20091125054237I. read more
Description: New. Please note that deliveries to addresses in the UK and Europe will be in 4-14 business days. Other countries should refer to Alibris standard times. This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. ISBN10: 0306472929. read more
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