|
Reliability, Yield, and Stress Burn-In
more books like this
by
Way Kuo, Kuo Way Kuo, Kary Chien Wei-Ting Kary Chien
"Reliability, Yield, and Stress Burn-In" explains reliability issues in Microelectronics Systems Manufacturing and Software Development with an emphasis on evolving manufacturing technology for the semiconductor industry. Since most microelectronics components have an infant mortality period of about one year under ordinary operating conditions, ...
see all copies
from $125.00!
new only
from $125.00!
|
SVS
|