|
High Resolution X-Ray Diffractometry and Topography
more books like this
by
D Keith Bowen, Keith D Bowen, Brian K Tanner
The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the ...
see all copies
from $100.00!
new only
from $132.63!
|
signed copies
|
first editions
|
SVS
|