VLSI Test Principles and Architectures: Design for Testability

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VLSI Test Principles and Architectures: Design for Testability - Wang, Laung-Terng, and Wu, Cheng-Wen, and Wen, Xiaoqing

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. . Most up-to-date coverage of design for testability. . Coverage of industry practices commonly found in commercial ... Read More

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VLSI Test Principles and Architectures: Design for Testability 2006, Morgan Kaufmann Publishers, Amsterdam, Netherlands

ISBN-13: 9780123705976

Hardcover

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