Celebrate our new site and save $15 Get code »

Defect Recognition and Image Processing in Semiconductors 1997: Proceedings of the Seventh Conference on Defect Recognition and Image Processing, Berlin, September 1997

by , ,

Defect Recognition and Image Processing in Semiconductors 1997: Proceedings of the Seventh Conference on Defect Recognition and Image Processing, Berlin, September 1997 - Doneker, J, and Donecker, J (Editor), and Rechenberg, I (Editor)

Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to ... Read More

Currently there are no copies available. However, our inventory changes frequently. Please check back soon or try Book Fetch.