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Self-Checking and Fault-Tolerant Digital Design

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With VLSI chip transistors getting smaller and smaller, today's digital systems are more complex than ever before. This increased complexity leads to more cross-talk, noise, and other sources of transient errors during normal operation. Traditional off-line testing strategies cannot guarantee detection of these transient faults. And with critical ...

Self-Checking and Fault-Tolerant Digital Design 2000, Morgan Kaufmann Publishers, San Francisco, CA

ISBN-13: 9780124343702

Hardcover

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