Scanning electron microscopy: physics of image formation and microanalysis

by

Write The First Customer Review

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed ...

Scanning Electron Microscopy: Physics of Image Formation and Microanalysis 2010, Springer-Verlag Berlin and Heidelberg GmbH & Co. K, Berlin

ISBN-13: 9783642083723

Trade paperback

Select
Scanning Electron Microscopy: Physics of Image Formation and Microanalysis 1998, Springer, Berlin, Germany

ISBN-13: 9783540639763

Hardcover

Select
Scanning Electron Microscopy: Physics of Image Formation and Microanalysis 1985, Springer-Verlag Berlin and Heidelberg GmbH & Co. K, Berlin

ISBN-13: 9783540135302

Hardcover

Select