High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures

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High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures - Pietsch, Ullrich, and Holy, Vaclav, and Baumbach, Tilo

During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of ...

High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures 2004, Springer, New York, NY

ISBN-13: 9780387400921

2nd edition

Hardcover

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